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            QT-6000 Discrete Device High-Speed Test System
            
                             
            QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand the built-in capacitance test (DC+CAP), EAS, VC, pA modules, and c
            
                             
             


            

            

            
	
		
            
			
				
            
					 
				
            
				
            
					Suspended power supply
				
            
			            		
			
				
            
					 
				
            
				
            
					Four quadrant circuit
				
            
			            		
			
				
            
					 
				
            
				
            
					High speed test
				
            
			            		
			
				
            
								 
				
            
				
            
					Supports multiple extensions
				
            
			            		
		
            
	            

            
                             
            
                             
            
                                                          
            
                    
            
             
            
    
              
    
            
    

            
	
		
            
			
				Type
            
			            		
			
				QT-6000
			
		
            
		
            
			
				Advantages 
			
			
				? QT-6000 discrete device high-speed testing machine has the performance advantages of high testing accuracy, fast testing speed, good stability, high reliability, and strong anti-interference ability. 
            
   ? Using a four-quadrant circuit can protect the device under test very well. 
            
   ? Adopts suspended power supply and fully symmetrical structure. 
            
   ? High-speed testing meets the requirements of sorting machines above UPH56K. 
            
			            		
		
            
		
            
			
				Main Features 
			
			
				? High speed test, UPH>40K
            
                         ? One-to-two can achieve 100% FT+QA parallel testing
            
                         ? Advanced capacitor high-speed test solution to achieve CAP+DC same-station test
            
                         ? Built-in UIS test solution to realize DC+UIS same-station test
            
                         ? LCR precision capacitance test, the minimum test capacitance value is 100fF
            
			            		
		
            
	            

            

            
                         
            
                         
            
                        

            

            

   
    
               
  

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