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            QT-3101 UIL avalanche test
            
                             
            QT-3101 UIL avalanche test is suitable for testing avalanche parameters of MOSFETs, IGBTs and diodes
            
                             
             


            

            

            
	
		
            
			
				
            
					 
				
            
				
            
					Support double DIE
				
            
			            		
			
				
            
					 
				
            
				
            
					Fast charging
				
            
			            		
			
				
            
					 
				
            
				
            
					Invalid waveform saving
				
            
			            		
			
				
            
					 
				
            
				
            
					Clamping function
				
            
			            		
		
            
	            

            
                             
            
                             
            
                                                          
            
                    
            
             
            
    
              
    
            
    

            
	
		
            
			
				Type 
			
			
				QT-3101 UIL
			
		
            
		
            
			
				Advantages 
			
			
				Support VDD ON(E=1/2L*I*I*BVDSS/(BVDSS-VDD)) or VDD OFF(E=1/2*L*I*I) test
            
         Built-in oscilloscope
            
         Extreme energy scan test
            
         Single pulse, multi-pulse or dual MOSFET testing can be set
            
         Can share a computer with QT-4100B to achieve unified management of test programs and data
            
			            		
		
            
		
            
			
				Main Features 
			
			
				? Output measurement capability: Maximum measurement BVdss: ±3000V Maximum output ID: ±150V, ±200A
            
                      ? Editable VG MAX: ±30V pulse width adjustment (resolution: 1us)
            
                      ? Programmable inductor box load 10μH-159.9mH step 10μH
            
                      ? 24 programmable sorting machine interface signals
            
			            		
		
            
	            

            


            

            

   
    
               
  
                
                
    
            
    
    
    
    
    
    
     
     
      

            

              
                 
            
            
            
            
    
            
    
    
    

              

  

  

            
            
            
            
            
            
            

            
   

            
  
    

  
 











            
    
    

            


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