第三代
            半導(dǎo)體測(cè)試家族
            Third generation semiconductor testing family
             
        
        
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            QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)
            
                             
            Suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.
            
                             
             


            

            

            
	
		
            
			
				
            
					 
				
            
				
            
					Suspended power supply
				
            
			            		
			
				
            
					 
				
            
				
            
					Multiple sites in parallel
				
            
			            		
			
				
            
					 
				
            
				
            
					Multi-channel high precision
				
            
			            		
			
				
            
					 
				
            
				
            
					Supports multiple extensions
				
            
			            		
		
            
	            

            
                             
            
                             
            
                                                          
            
                    
            
             
            
    
              
    
            
    

            
	
		
            
			
				Model 
			
			
				QT-8100
			
		
            
		
            
			
				Product Advantages 
			
			
				
            
					The digital-analog hybrid IC test system is suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.
				
            
			            		
		
            
		
            
			
				Key Features 
			
			
				? Float V/I source with 4 quadrants
            
           ? Full resource extracted from the test box,support more than 8site test
            
           ? Digital speed 51.2MHz, vector depth 64M
            
           ? True parallel test, multiple 1000V/20A high voltage and high current
            
           ? 18 bit high precision sampling
            
           ? Multi-channel analog capability, supports up to 400 VI channels,Multi-channel digital capability, supports a maximum of 256VI channels
            
           ? Multi-channel high precision time measurement unit, supporting ns level time measurement
            
           ? Support RF module expansion
            
           ? Efficient communication configuration for more efficient testing
            
			            		
		
            
	            

            

            
                              
            
                              
            
                             
            

   
    
               
  
                
                
    
            
    
    
    
    
    
    
            
        
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