第三代
            半導(dǎo)體測(cè)試家族
            Third generation semiconductor testing family
             
        
        
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            QT-8600RF Mixed Signal RF Test System
            
                             
            RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
            
                             
             


            

            

            
	
		
            
			
				
            
					 
				
            
				
            
					Suspended power supply
				
            
			            		
			
				
            
					
				
            
				
            
					Multiple sites in parallel
				
            
			            		
			
				
            
					
				
            
				
            
					Multi-channel high precision
				
            
			            		
			
				
            
					
				
            
				
            
					Supports multiple extensions
				
            
			            		
		
            
	            

            
                             
            
                             
            
                                                          
            
                    
            
             
            
    
              
    
            
    

            
	
		
            
			
				Model 
			
			
				QT-8600RF Mixed Signal RF Test System
			
		
            
		
            
			
				Product Advantages 
			
			
				RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
			
		
            
		
            
			
				Key Features 
			
			
				? DC, digital, RF integrated machine
            
   ? 16 RF ports (8 in & 8 out) 
            
   ? 6Ghz RF measurement circuit, power can be configured to 48dBm
            
   ? Self-developed RF source board and algorithm, UPH improves by more than 90% compared with traditional ones
            
   ? Supports vector and scalar testing
            
   ? Digital meets MIPI 50Mhz or above test
            
   ? Supports 2-station RF parallel testing and multi-station composite testing
            
   ? Provide a cost-effective test platform for RF switches, LNA, TUNER, filters and other devices. 
            
			            		
		
            
	            

            

            
                           
            
                           
            
                          
            

   
    
               
  
                
                
    
            
    
    
    
    
    
    
            
        
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