QT-8400 power device multi-site test system
            Explore the infinite possibilities of third-generation transistors

            test host

            GaN Test Kit

            Power Device Test Kit

            QT-8400 is composed of test host and test station Test Kit,
            There are two types of Test Kit: Power Device Test Kit & GaN Test Kit.

            Test Kit
            Can be selected according to needs
            • Power Device Test Kit

              Power Device Test Kit for CP testing needs such as MOSFET/SIC, diodes, transistors, etc.

            • GaN Test Kit

              GaN Test Kit for Gallium Nitride testing needs.

            105cm
            Standing keyboard height
            75cm
            Sitting keyboard height
            Sign design
            Stand & sit
            quick switch
            Heart-touching
            user experience

            Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

            * Patent applied

            Sign design
            Stand & sit
            quick switch
            Heart-touching
            User experience

            Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

            * Patent applied

            105cm
            Standing keyboard height
            75cm
            Sitting keyboard height
            Parallel testing
            doubles efficiency
            Supports 2/4/8/16 Site parallel testing to meet customer needs for higher testing efficiency.
            Testing needs,
            comprehensive coverage
            QT-8400 platform provides 20A/100A, 1KV/2KV multi-site test solutions, support extended high voltage/DC modules, up to 8KV, 2000A, support extended avalanche, RGCG, dynamic RDson and other dynamic parameter test modules, to meet the third generation of semiconductor testing needs

            QT-8400 GaN

            QT-8400 D

            Test Range

            Dedicated to testing dynamic and static electrical parameters of gallium nitride

            Test Range

            Dedicated to MOSFET/SIC, diodes, transistors, IGBT and other CP testing.

            Parameter index

            Floating V/I Source
            Voltage 1KV/2KV
            20A/100A;

            Parameter index

            Floating V/I Source
            Voltage 1KV/2KV/3KV
            20A/100A/200A

            Number of parallel tests

            2/4/8/16 Site

            Number of parallel tests

            2/4/8/16 Site

            Extensible dynamic modules

            LCR test module (CG)
            Dynamic RDSON module (supports hard and soft cutting)

            Extensible dynamic modules

            Avalanche test module (UIS, EAS)
            LCR test module (RG, CG)

            Expandable high voltage/DC module

            Expandable up to 8KV, 2KA

            Expandable high voltage/DC module

            Expandable up to 8KV, 2KA

            Precise measurement

            The GaN Test Kit has a built-in precision measurement circuit to achieve accurate measurements at the nA level and mΩ level.

            Precise measurement

            The Power Device Test Kit has a built-in precision measurement circuit to achieve nA-level and mΩ-level accurate measurements.

            Flexible allocation
            of board resources
            Our equipment adopts a pluggable board architecture, allowing you to flexibly match boards according to your needs, thereby achieving precise control of testing costs.
            Comprehensive functions to
            meet various needs
            The test host boards are all four-quadrant V/I sources, equipped with AWG and oscilloscope, and have comprehensive functions to meet various scanning test needs such as I-V curves.

            Built-in oscilloscope graph

            AWG Editor
            PTS OS is intuitive and easy to use,
            Designed for testing & production
            We have fully optimized the QT-8400 PTS OS software interface to improve practicality, aesthetics and ease of use. Greatly improve the efficiency of test development, production and debugging and calibration, making it easy for users to operate efficiently.

            * Patent applied

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