第三代
            半導(dǎo)體測試家族
            Third generation semiconductor testing family
             
        
        
            首頁 產(chǎn)品中心 Test System Power module and device testing system
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            QT-8409IPM Intelligent Power Module Test System
            
                             
            QT-8409IPM power module dynamic and static test system
Meet the power IPM module dynamic and static electrical parameters test
            
                             
             


            

            

            
	
		
            
			
				
            
					 
				
            
				
            
					Low stray
            
            
				
            
			            		
			
				
            
					 
				
            
				
            
					DC/AC at the same station
            
            
				
            
			            		
			
				
            
					 
				
            
				
            
					Multi-channel high precision
				
            
			            		
			
				
            
					 
				
            
				
            
					Supports multiple extensions
				
            
			            		
		
            
	            

            
                             
            
                             
            
                                                          
            
                    
            
             
            
    
              
    
            
    

            
	
		
            
			
				Type 
			
			
				QT-8409IPM
			
		
            
		
            
			
				Advantages 
			
			
				Board performance is superior,and bring higher test efficiency, reduce the cost of test, short-circuit test performance is leading
            
			            		
		
            
		
            
			
				Main Features 
			
			
				? Provides 40A/1KV statically and supports expansion to 100A/2KV
            
                       ? Dynamically provide 100A/1KV switching characteristics test and 300A short circuit characteristics
            
                       ? One-stop testing of static parameters and dynamic parameters
            
			            		
		
            
	            

            

            
                       
            
                       
            
                      
            

   
    
               
  
                
                
    
            
    
    
    
    
    
    
            
        
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