第三代
            半導體測試家族
            Third generation semiconductor testing family
            首頁 產(chǎn)品中心 Test System Power module and device testing system
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            QT-8409PIM high-power dynamic and static comprehensive test system

            QT-8409PIM power module dynamic and static test system Applied to IGBT/SIC power module DC/AC dynamic and static parameter test, support high temperature/normal temperature, mass production/manual test, automatic/semi-automatic application scenarios



            High-speed short-circuit protection

            Low stray

            Flexible tooling

            Suitable for mass production/manual test

            Type
            QT-8409PIM
            Advantages Industry leading short circuit protection speed, effective protection of Socket, low stray solution
            Quickly change different tooling
            Main Features ? Support 4 stations
            ? ISC 12KA LS<30nH
            ? AC:SW、 TRR 、ISC、QG、RBSOA test
            ? AC@3000A 1500V
            ? DC@2000A 2KV /3KV/6KV/8KV
            ? Protect Clamp<2us
            ? Test object:PIM IGBT module, SiC module, DBC, three level products, etc

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