第三代
            半導(dǎo)體測試家族
            Third generation semiconductor testing family
            首頁 產(chǎn)品中心 Test System Power Device Testing System
            分類
             
            QT-3102 thermal resistance tester

            QT-3102-XX test device type: triode, field effect tube, IGBT, diode



            Support double DIE

            1000W thermal resistance

            Overload and undervoltage protection



            Type QT-3102
            Advantages QT-3102-XX test device type: triode, field effect tube, IGBT, diode
            R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing
            R26:Dual Die testing can be implemented through scanbox
            Main Features ? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively.
            ? The maximum voltages are 100V and 200V respectively




            Items Range Step Current Precision
            Bias Current 0.01 to 20A/50a 0.01a ±1%+2mA
            Measuring Current 1 to 100mA 1 mA 1 to 39 mA
            ±1% + 0.2 mA
            40 to 100 mA ±3%
            Threshold Voltage Fixed initial value of ± 5V 0.1V ±0.5V
            Power Consumption Time 300us to 200ms in the offset power range 1 us Crystal
            Delay Time 10 to 999 us 1 us ±1 us 晶體
            Upper/Lower Limit 0 to 9999 mV 1 mV /
            0 to 999.9 mV 0.1mV /
            VCB/VDS 1 to 100V / 200V 1 V ±0.2% + 0.1V
            Recommend推薦產(chǎn)品
            日韩a级无码免费一级视频,亚洲免费av在线播放,91精品国产福利尤物,国产一级精品免费在线日韩一区二区三区 超碰日本中文字幕 超碰人人在线免费亚洲