第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
QT-3104 QG gate charge test
QT-3104 QG meets the tiny QG value test of SiC devices.
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Support double DIE |
Overload and undervoltage protection |
High precision testing |
Support extension |
| Model | QT-3104 QG |
| Product Advantages | Meets the tiny QG value test of SiC devices |
| Key Features | ? Test capability: 200A/150V 150A/1000V |
Recommend推薦產(chǎn)品
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0757 83207313 (銷售) |
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0757 83208786 (銷售) |
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info@powertechsemi.com |
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