第三代
            半導(dǎo)體測試家族
            Third generation semiconductor testing family
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            QT-3105 TRR diode reverse recovery test

            Self-developed LCR digital bridge supports Mosfet RG/CG test and can also be used to test the capacitance of diodes, with a resolution of 1fF



            Independent programmable power supply

            Support double DIE

            Dual channel test

            Waveform display

            Type QT-3105TRR
            Advantages Supports dual-core TRR parameter testing, equipped with VRR voltage probe
            Main Features ? Output capability IF 100A VR 1KV di/dt>1000A Measurement resolution 0.1ns

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