第三代
            半導體測試家族
            Third generation semiconductor testing family
            首頁 產(chǎn)品中心 Test System Power Device Testing System
            分類
             
            QT-3107 LCR RG/CG test

            Self-developed LCR digital bridge supports Mosfet RG/CG testing and can also be used to test the capacitance of diodes with a resolution of 1fF.



            Support double DIE

            High precision and anti-interference

            Fast testing

            Extended 2KV bias

            Model QT-3107
            Product Advantages Using digital bridge, it has strong anti-interference ability and high test accuracy;
            The test time is 2-3 times faster than the analog bridge;
            Bias voltage up to 2KV;
            Key Features Test resolution 1fF;
            Self-equipped with ±100V bias source;
            Test frequency: 1MHz, extended to 2MHz;
            Output amplitude: 0.025-2V;




            Testing standards檢測標準
            Recommend推薦產(chǎn)品
            日韩a级无码免费一级视频,亚洲免费av在线播放,91精品国产福利尤物,国产一级精品免费在线日韩一区二区三区 超碰日本中文字幕 超碰人人在线免费亚洲