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QT-3108SW dynamic test solution

Low spurious 247/TPAK dynamic test solution: consists of QT-3108SW dynamic test system and gravity handler.
Supports dynamic parameter testing of TO247/TPAK SiC MOS IGBT packaged devices.

Multiple security protections

●  Support overload and undervoltage protection
●  RG 1-512 linearly adjustable
●  Load inductance 10-1100uH step 10uH
●  Short circuit protection<1us
●  Support KGD test pin card protection circuit

Testing Requirements, comprehensive coverage

QT-3108SW has complete functions and supports SW, ISC, TRR (series parameters),
ILATCH, SCSOA, QG parameter testing, optional UIS.

Application Environment

The test application board is directly connected to the handler

Turn-on/turn-off delay TDON/TDOFF

Measuring range: 0~2us
Stability: ±3%

Rise/fall time TR/TF

Measuring range: 0~2us
Stability: ±3%

Reverse recovery time TRR

Measuring range: 0~5us
Stability: ±3%

Reverse recovery charge QRR

Measuring range: 0～10uC;
Stability: ±3%

Total gate charge QG

Measuring range: 0~100uC;
Stability: ±3%

Short circuit current SCCOA

Measuring range: 0~5000 A;
Stability: ±3%

Clamp current ILATCH

Measuring range: 25~1000 A;
Stability: ±3%

Threshold voltage VTH

Measuring range: 0～10.0V;
Stability: ±3%

< 30nH

Stray inductance

Integrated testing,

To solve the problem of poor test results caused by wire distributed inductance.

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