第三代
            半導(dǎo)體測(cè)試家族
            Third generation semiconductor testing family
             
        
        
            首頁(yè) 產(chǎn)品中心 Test System Power Device Testing System
            分類
            
    
             
             
     
    
            
    
             
            
        
              
        
           
             
        
                         
               
        
                
                
                
        
            
    
            
      
     
    
    
             
            
            
            
                  
            
                       
                       
              
                          
                                             
                       
     
                          
                          
                       
            
           
                 
            
                 
            
           
                
                   

            
    
            
             
                       
                        
            
                            
            
                                
            
                                    
            
                                    
                                                        
                                                    
                        
                                                           
                        
                                                           
                        
                                 
                
                
                
                
                                        
                                                   
                                    
            
                                    
            
                                    
            
                                    
            
                                
            
                            
            
                            
            
                                                        
                            
                            
                            
             
                        
            
             
            
             
            
                    
            
                             
            QT-DRM101000 GaN Dynamic RDON
            
                             
            Suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution
            
                             
             


            

            

            
	
		
            
			
				
            
					  
				
            
				
            
					Hard handover <1us
            
                 
				
            
			            		
			
				
            
					  
				
            
				
            
					Supports resistive/ 
				
            
				
            
					inductive loads 
				
            
			            		
			
				
            
					  
				
            
				
            
					Support hard/ 
				
            
				
            
					soft handover
            
                 
				
            
			            		
			
				
            
					  
				
            
				
            
					Multiple-pulse output
            
                 
				
            
			            		
		
            
	            

            
                             
            
                             
            
                                                          
            
                    
            
             
            
    
              
    
            
    

            
	
		
            
			
				Type 
			
			
				QT-DRM101000
			
		
            
		
            
			
				Advantages 
			
			
				
            
					QT-DRM101000 is suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution
				
            
			            		
		
            
		
            
			
				Main Features 
			
			
				
            
					? Support FT or CP, laboratory, mass production testing
				
            
				
            
					? Hard handover and soft handover, hard handover can meet the requirement of<1uS measurement RDON 
				
            
				
            
					? Output capacity 10A/1000V
				
            
				
            
					
            
				
            
			            		
		
            
	            

            

            
                               
            

   
    
               
  
                
                
    
            
    
    
    
    
    
    
            
        
            Recommend推薦產(chǎn)品
              
    
                
              
                 
              
                 
              
                 
              
                 
                         
             
               
              
               
                
              
                
              

                
                

                
             
    
    
    
            
     
     
      

            

              
                 
            
            
            
            
    
            
    
    
    

              

  

  

            
            
            
            
            
            
            

            
   

            



    

  
 












            
    
    

            


日韩a级无码免费一级视频,亚洲免费av在线播放,91精品国产福利尤物,国产一级精品免费在线日韩一区二区三区
超碰日本中文字幕
超碰人人在线免费亚洲