第三代
            半導(dǎo)體測試家族
            Third generation semiconductor testing family
             
        
        
            首頁 產(chǎn)品中心 Vision QuickView Visual Detection System
            分類
            
    
             
             
     
    
            
    
             
            
        
              
        
           
             
        
                         
               
        
                
                
                
        
            
    
            
      
     
    
    
             
            
            
            
                  
            
                       
                       
              
                          
                                             
                       
     
                          
                          
                       
            
           
                 
            
                 
            
           
                
                   

            
    
            
             
                       
                        
            
                            
            
                                
            
                                    
            
                                    
                                                        
                                                    
                        
                                                           
                        
                                                           
                        
                                 
                
                
                
                
                                        
                                                   
                                    
            
                                    
            
                                    
            
                                    
            
                                
            
                            
            
                            
            
                                                        
                            
                            
                            
             
                        
            
             
            
             
            
                    
            
                             
            3D inspection station
            
                             
            Designed and developed based on the needs of the semiconductor industry, using industrial cameras and industrial computers with stable operation, accurate digital transmission, rapid response, clear picture capture, complete and reliable
            
                             
             


            

            

            
	
		
            
			
				
            
					 
				
            
				
            
					Suspended power supply
				
            
			            		
			
				
            
					 
				
            
				
            
					Multiple sites in parallel
				
            
			            		
			
				
            
					 
				
            
				
            
					Multi-channel high precision
				
            
			            		
			
				
            
					 
				
            
				
            
					Supports multiple extensions
				
            
			            		
		
            
	            

            
                             
            
                             
            
                                                          
            
                    
            
             
            
    
              
    
            
    

            
	
		
            
			
				Type 
			
			
				3D inspection station
			
		
            
		
            
			
				Description 
			
			
				It fully meets the production speed of the highest-speed Handler and has complete testing stations to meet various testing needs of customers. QV series inspection system, configurable inspection stations include: 3D inspection station, printing station, taping station, direction station, etc.
            
           This system can be used with various Handlers, and the detection range covers various types of semiconductor devices, such as: SOT23, SOD123, SOD323, SOD523, SOD923, SMA, SMB, SMC, SOD882(1006), TO92, TO252, SOD129, MBS, SOP8L and other software The system provides Chinese and English interfaces, multi-level authority control, and a high degree of automation.
            
     The software system is 100% linked and developed, and according to the machine vision inspection process, the combination is optimized and easy to operate and apply.
            
     All parameters of industrial cameras, such as shutter time, gain, contrast, light source brightness, etc., can be adjusted through software.
            
     The QV series machine vision identification system is used for various packaged devices in the semiconductor industry to conduct all-round, high-precision visual inspection of product pins and plastic packages, such as fonts, 2D pins, 3D pins, and plastic package surface defects.
            
     Convenient application, simple operation, stable system operation, improving customers' production capacity.
            
     Timely detect the accuracy of various devices in the semiconductor industry to improve production efficiency.
            
     Perform calibration quickly, ensure zero defective rate, and improve production quality.
            
			            		
		
            
		
            
			
				Function 
			
			
				? Detect device pin information (foot length, foot width, foot spacing, foot offset, standing strength, inclination, span, pin length difference, etc.)
            
                   ? Detect the seal content on the surface of the device (typos, multiple characters, missing characters, defacement, offset, blurred reprint, scratches, cracked plastic package, etc.)
            
                   ? Detect device side information (scratches, cracks, bubbles, etc.)
            
			            		
		
            
		
            
			
				Basic Configuration 
			
			
				CCD cameras, industrial lenses, LED light sources, mechanical structural parts
            
			            		
		
            
		
            
			
				 SI Detection 
			
			
				The minimum area is 0.7mm*0.7mm, and the overall average grayscale difference is more than 40
            
			            		
		
            
		
            
			
				GR&R 
			
			
				<10% 
			
		
            
	            

            

            

   
    
               
  
                
                
    
            
    
    
    
    
    
    
            
        
            Recommend推薦產(chǎn)品
              
    
                
              
                 
              
                 
              
                 
              
                 
                         
             
               
              
               
                
              
                
              

                
                

                
             
    
    
    
            
     
     
      

            

              
                 
            
            
            
            
    
            
    
    
    

              

  

  

            
            
            
            
            
            
            

            
   

            



    

  
 












            
    
    

            


日韩a级无码免费一级视频,亚洲免费av在线播放,91精品国产福利尤物,国产一级精品免费在线日韩一区二区三区
超碰日本中文字幕
超碰人人在线免费亚洲