第三代
            半導(dǎo)體測試家族
            Third generation semiconductor testing family
            首頁 產(chǎn)品中心 Test System Power Device Testing System
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            KGD (Know Good Die) testing solution

            Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG; Support testing pin card protection scheme; Provide a complete set of testing + sorting solutions;



            Pin card 

            protection

              

            Two-DUT test in parallel

            High temperature and 

            normal temperature

            Data merge

            Model KGD testing solutions
            Product Advantages ? Low spurious solutions;
            ? Exclusive pin card protection patented technology;
            ? Overload and undervoltage protection;
            ? Test two wafers at a time;
            ? Supports high temperature heating




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