第三代
            半導(dǎo)體測試家族
            Third generation semiconductor testing family
             
        
        
    
             
             
     
    
            
    
             
            
        
              
        
           
             
        
                         
               
        
                
                
                
        
            
    
            
      
     
    
    
             
            
            
            
                  
            
                       
                       
              
                          
                                             
                       
     
                          
                          
                       
            
           
                 
            
                 
            
           
                
                   

            
    
            
             
                       
                        
            
                            
            
                                
            
                                    
            
                                    
                                                        
                                                    
                        
                                 
                
                
                
                
                                        
                                                   
                                    
            
                                    
            
                                    
            
                                    
            
                                
            
                            
            
                            
            
                                                        
                            
                            
                            
             
                        
            
             
            
             
            
                    
            
                             
            Prober
            
                             
            Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading.
Fully automatic CCD visual n
            
                             
             


            

            

            
	
		
            
			
				
            
					 
				
            
				
            
					Suspended power supply
				
            
			            		
			
				
            
					 
				
            
				
            
					Multiple sites in parallel
				
            
			            		
			
				
            
					 
				
            
				
            
					Multi-channel high precision
				
            
			            		
			
				
            
					 
				
            
				
            
					Supports multiple extensions
				
            
			            		
		
            
	            

            
                             
            
                             
            
                                                          
            
                    
            
             
            
    
              
    
            
    

            
	
		
            
			
				Model 
			
			
				Prober
			
		
            
		
            
			
				Product introduction 
			
			
				Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading. 
            
			            		
		
            
		
            
			
				Features 
			
			
				? Fully automatic CCD visual needle positioning. 
            
         ? High-precision positioning platform. 
            
         ? Support normal high temperature testing. 
            
         ? Generate Mapping display Bin in real time. 
            
         ? Universal GPIB, TTL, R-232 interface. 
            
			            		
		
            
	            

            

            
                           
            

   
    
               
  
                
                
    
            
    
    
    
    
    
    
            
        
            Recommend推薦產(chǎn)品
              
    
                
              
                 
              
                 
              
                 
              
                 
                         
             
               
              
               
                
              
                
              

                
                

                
             
    
    
    
            
     
     
      

            

              
                 
            
            
            
            
    
            
    
    
    

              

  

  

            
            
            
            
            
            
            

            
   

            



    

  
 












            
    
    

            


日韩a级无码免费一级视频,亚洲免费av在线播放,91精品国产福利尤物,国产一级精品免费在线日韩一区二区三区
超碰日本中文字幕
超碰人人在线免费亚洲