第三代
            半導體測試家族
            Third generation semiconductor testing family
            分類
             
            KGD handler



            Suspended power supply

            Multiple sites in parallel

            Multi-channel high precision

            Supports multiple extensions

            Model KGD handler
            Product introduction Fully automatic testing, supporting SiC wafer, Waffle Pack, Tape&Reel loading and unloading.
            Features ? Multi-station parallel testing, different stations support different temperatures and test items.
            ? Static, dynamic, avalanche function testing, and the test sequence is adjustable.
            ? High temperature preheating and chip surface anti-oxidation protection.
            ? High temperature test, temperature range: room temperature~200°C.
            ? The power-on pin card is sealed and supports nitrogen filling to protect against high-pressure sparks and nitrogen pressure monitoring.


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